Experimental Characterization of the Thermal Time Constants...

IEEE Transactions on Electron Devices 2017 / 5 Vol. 64; Iss. 5

Experimental Characterization of the Thermal Time Constants of GaN HEMTs Via Micro-Raman Thermometry

Bagnall, Kevin R., Saadat, Omair I., Joglekar, Sameer, Palacios, Tomas, Wang, Evelyn N.
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2679978
Date:
May, 2017
File:
PDF, 1.20 MB
english, 2017
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