[IEEE 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Characterization of Warpages and Layout-Dependent Local-Deformations for Large Die 3D Stacking
Dote, Aki, Kitada, Hideki, Mizushima, Yoriko, Nakamura, Tomoji, Sakuyama, SeikiYear:
2016
Language:
english
DOI:
10.1109/ectc.2016.182
File:
PDF, 518 KB
english, 2016