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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 28 January 2017)] Slow Light, Fast Light, and Opto-Atomic Precision Metrology X - Level anti-crossing magnetometry with color centers in diamond
Shahriar, Selim M., Scheuer, Jacob, Zheng, Huijie, Chatzidrosos, Georgios, Wickenbrock, Arne, Bougas, Lykourgos, Lazda, Reinis, Berzins, Andris, Gahbauer, Florian Helmuth, Auzinsh, Marcis, Ferbers, RuVolume:
10119
Year:
2017
Language:
english
DOI:
10.1117/12.2261160
File:
PDF, 5.16 MB
english, 2017