Reliability challenge of ESD protection: From planner SOI...

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Modern Physics Letters B 2017 / 04

Reliability challenge of ESD protection: From planner SOI MOSFET to SOI FinFET

Jiang, Yibo, Bi, Hui, Dong, Liangwei, Li, Qinglong
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Language:
english
Journal:
Modern Physics Letters B
DOI:
10.1142/S0217984917400048
Date:
April, 2017
File:
PDF, 1.65 MB
english, 2017
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