Thermal Effects During Low-Voltage Electron-Probe X-Ray...

Measurement Techniques 2017 / 1 Vol. 59; Iss. 10

Thermal Effects During Low-Voltage Electron-Probe X-Ray Spectral Microanalysis with Nanometer Localization

Kuzin, A. Yu., Stepovich, M. A., Mityukhlyaev, V. B., Todua, P. A., Filippov, M. N.
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Volume:
59
Language:
english
Journal:
Measurement Techniques
DOI:
10.1007/s11018-017-1092-8
Date:
January, 2017
File:
PDF, 145 KB
english, 2017
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