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[IEEE 2017 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2017.1.23-2017.1.26)] 2017 Annual Reliability and Maintainability Symposium (RAMS) - New FIDES models for emerging technologies
Carton, Patrick, Giraudeau, Michel, Davenel, FranckYear:
2017
Language:
english
DOI:
10.1109/RAM.2017.7889686
File:
PDF, 788 KB
english, 2017