[IEEE 2017 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2017.1.23-2017.1.26)] 2017 Annual Reliability and Maintainability Symposium (RAMS) - MBSE-assisted FMEA approach — Challenges and opportunities
Huang, Zhaofeng, Swalgen, Stuart, Davidz, Heidi, Murray, JuliaYear:
2017
Language:
english
DOI:
10.1109/RAM.2017.7889722
File:
PDF, 1.23 MB
english, 2017