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[IEEE 2017 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2017.1.23-2017.1.26)] 2017 Annual Reliability and Maintainability Symposium (RAMS) - New model for stress tests without failures
Lewitschnig, Horst, Haselgruber, NikolausYear:
2017
Language:
english
DOI:
10.1109/RAM.2017.7889753
File:
PDF, 741 KB
english, 2017