![](/img/cover-not-exists.png)
[IEEE 2017 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2017.1.23-2017.1.26)] 2017 Annual Reliability and Maintainability Symposium (RAMS) - Multiple priors integration for reliability estimation using the Bayesian melding method
Li, Zhaojun Steven, Guo, Jian, Xiao, Ning-Cong, Huang, WeiYear:
2017
Language:
english
DOI:
10.1109/RAM.2017.7889799
File:
PDF, 633 KB
english, 2017