[IEEE 2017 Annual Reliability and Maintainability Symposium...

  • Main
  • [IEEE 2017 Annual Reliability and...

[IEEE 2017 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2017.1.23-2017.1.26)] 2017 Annual Reliability and Maintainability Symposium (RAMS) - Multiple priors integration for reliability estimation using the Bayesian melding method

Li, Zhaojun Steven, Guo, Jian, Xiao, Ning-Cong, Huang, Wei
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.1109/RAM.2017.7889799
File:
PDF, 633 KB
english, 2017
Conversion to is in progress
Conversion to is failed