SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing,...

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SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Wednesday 12 October 2016)] Optical Metrology and Inspection for Industrial Applications IV - Development of an edge sensor based on polyview optics and laser triangulation principle

Han, Sen, Yoshizawa, Toru, Zhang, Song, Li, Yinan, Bossmeyer, Hagen, Kästner, Markus, Reithmeier, Eduard
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Volume:
10023
Year:
2016
Language:
english
DOI:
10.1117/12.2247007
File:
PDF, 769 KB
english, 2016
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