[IEEE 2017 33rd Thermal Measurement, Modeling &...

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[IEEE 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2017.3.13-2017.3.17)] 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - Thermal analysis of hybrid circuits with variable heat transfer coefficient

Torzewicz, Tomasz, Samson, Agnieszka, Raszkowski, Tomasz, Sobczak, Artur, Janicki, Marcin, Zubert, Mariusz, Napieralski, Andrzej
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Year:
2017
Language:
english
DOI:
10.1109/SEMI-THERM.2017.7896902
File:
PDF, 653 KB
english, 2017
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