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[IEEE 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2017.3.13-2017.3.17)] 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - High temperature submicron SOI CMOS technology characterization for analog and digital applications up to 300°C
Petrosyants, Konstantin O., Lebedev, Sergey V., Sambursky, Lev M., Stakhin, Veniamin G., Kharitonov, Igor A., Ismail-zade, Mamed R., Ignatov, Pavel V.Year:
2017
Language:
english
DOI:
10.1109/SEMI-THERM.2017.7896935
File:
PDF, 681 KB
english, 2017