[IEEE 2017 33rd Thermal Measurement, Modeling &...

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[IEEE 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2017.3.13-2017.3.17)] 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - The interface in molybdenum-copper-composites used for thermal management applications

Seiss, M., Mrotzek, T., Jantsch, U., Klimenkov, M., Reiser, J., Knabl, W.
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Year:
2017
Language:
english
DOI:
10.1109/SEMI-THERM.2017.7896937
File:
PDF, 615 KB
english, 2017
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