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[IEEE 2016 IEEE Frontiers in Education Conference (FIE) - Eire, PA, USA (2016.10.12-2016.10.15)] 2016 IEEE Frontiers in Education Conference (FIE) - Integrating analytics and surveys to understand fully engaged learners in a highly-technical STEM MOOC
Hicks, Nathan M., Roy, Doipayan, Shah, Siddharth, Douglas, Kerrie A., Bermel, Peter, Diefes-Dux, Heidi A., Madhavan, KrishnaYear:
2016
Language:
english
DOI:
10.1109/fie.2016.7757735
File:
PDF, 891 KB
english, 2016