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[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Determining the root cause of a neighbouring-cell-interaction-induced latch-up failure event
Ho, H. W., Lau, Wendy W. Y., Goh, S. H., Yeoh, B. L., Seungje, M., He, R., Lam, JeffreyYear:
2016
DOI:
10.1109/ipfa.2016.7564247
File:
PDF, 389 KB
2016