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Microelectronics Reliability 2017 / 4

Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages

Fan, Jiajie, Yu, Chaohua, Qian, Cheng, Fan, Xuejun, Zhang, Guoqi
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.04.012
Date:
April, 2017
File:
PDF, 2.83 MB
english, 2017
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