[ASME ASME 2003 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - Chicago, Illinois, USA (September 2–6, 2003)] Volume 1: 23rd Computers and Information in Engineering Conference, Parts A and B - Automation of Linear Tolerance Charts and Extension to Statistical Tolerance Analysis
Shen, Zhengshu, Shah, Jami J., Davidson, Joseph K.Volume:
2003
Year:
2003
Language:
english
DOI:
10.1115/DETC2003/CIE-48179
File:
PDF, 665 KB
english, 2003