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[IEEE 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Tokyo, Japan (2017.3.13-2017.3.17)] 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - A Model for T-Way Fault Profile Evolution during Testing
Kuhn, D. Richard, Kacker, Raghu N., Lei, YuYear:
2017
Language:
english
DOI:
10.1109/ICSTW.2017.35
File:
PDF, 763 KB
english, 2017