[IEEE 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Tokyo, Japan (2017.3.13-2017.3.17)] 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Mutation-Based Test-Case Generation with Ecdar
Larsen, Kim G., Lorber, Florian, Nielsen, Brian, Nyman, Ulrik M.Year:
2017
Language:
english
DOI:
10.1109/ICSTW.2017.60
File:
PDF, 434 KB
english, 2017