SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Interferometry XVIII - Dual-phase-shift schemes for internal-reflection noise reduction in a Fizeau interferometer
Creath, Katherine, Burke, Jan, Albertazzi Gonçalves, Armando, Kumagai, Toshiki, Hibino, Kenichi, Nagaike, YasunariVolume:
9960
Year:
2016
Language:
english
DOI:
10.1117/12.2237494
File:
PDF, 418 KB
english, 2016