A Genetic Algorithm based Heuristic Method for Test Set...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2017

A Genetic Algorithm based Heuristic Method for Test Set Generation in Reversible Circuits

A N, Nagamani, Nayak, Anuktha S., N, Nanditha N., Agrawal, Vinod K.
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2017.2695881
File:
PDF, 706 KB
english, 2017
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