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Switching mechanism in resistive random access memory by first-principles calculation using practical model based on experimental results
Moriyama, Takumi, Yamasaki, Takahiro, Hida, Sohta, Ohno, Takahisa, Kishida, Satoru, Kinoshita, KentaroVolume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.04CE12
Date:
April, 2017
File:
PDF, 919 KB
english, 2017