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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Optical System Alignment, Tolerancing, and Verification X - Toward image registration process: Using different interpolation methods in case of subpixel displacement

Sasián, José, Youngworth, Richard N., Flores Padilla, Deyanira, Jimenez-Hernández, Hugo, Reynosa Canseco, Jaqueline
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Volume:
9951
Year:
2016
Language:
english
DOI:
10.1117/12.2237961
File:
PDF, 546 KB
english, 2016
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