SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Optical System Alignment, Tolerancing, and Verification X - Toward image registration process: Using different interpolation methods in case of subpixel displacement
Sasián, José, Youngworth, Richard N., Flores Padilla, Deyanira, Jimenez-Hernández, Hugo, Reynosa Canseco, JaquelineVolume:
9951
Year:
2016
Language:
english
DOI:
10.1117/12.2237961
File:
PDF, 546 KB
english, 2016