SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 28 January 2017)] Gallium Nitride Materials and Devices XII - 200-mm GaN/Si technology for power device applications (Conference Presentation)
Chyi, Jen-Inn, Fujioka, Hiroshi, Morkoç, Hadis, Nanishi, Yasushi, Schwarz, Ulrich T., Shim, Jong-In, Egawa, TakashiVolume:
10104
Year:
2017
Language:
english
DOI:
10.1117/12.2250249
File:
PDF, 119 KB
english, 2017