SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 28 January 2017)] Gallium Nitride Materials and Devices XII - Use of sub-bandgap optical pumping to identify defects in AlGaN/GaN high electron mobility transistors (Conference Presentation)
Chyi, Jen-Inn, Fujioka, Hiroshi, Morkoç, Hadis, Nanishi, Yasushi, Schwarz, Ulrich T., Shim, Jong-In, Ren, Fan, Pearton, Stephen J., Kang, Tsung Sheng, Cheney, David J., Gila, Brent P.Volume:
10104
Year:
2017
Language:
english
DOI:
10.1117/12.2251166
File:
PDF, 116 KB
english, 2017