Development and validation of ANN approach for extraction of MESFET/HEMT noise model parameters
Ɖorđević, Vladica, Marinković, Zlatica, Marković, Vera, Pronić-Rančić, OliveraLanguage:
english
Journal:
Electrical Engineering
DOI:
10.1007/s00202-017-0526-2
Date:
April, 2017
File:
PDF, 909 KB
english, 2017