Analysis of the substrate bias effect on the interface...

Microelectronic Engineering 2017 / 06 Vol. 178

Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization

Doria, Rodrigo Trevisoli, Trevisoli, Renan, de Souza, Michelly, Barraud, Sylvain, Vinet, Maud, Faynot, Olivier, Pavanello, Marcelo Antonio
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Volume:
178
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2017.04.014
Date:
June, 2017
File:
PDF, 573 KB
english, 2017
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