![](/img/cover-not-exists.png)
[IEEE 2017 IEEE EMBS International Conference on Biomedical & Health Informatics (BHI) - Orland, FL, USA (2017.2.16-2017.2.19)] 2017 IEEE EMBS International Conference on Biomedical & Health Informatics (BHI) - Computerized measurement of melanoma depth of invasion in skin biopsy images
Xu, Hongming, Wang, Huiquan, Berendt, Richard, Jha, Naresh, Mandal, MrinalYear:
2017
Language:
english
DOI:
10.1109/BHI.2017.7897194
File:
PDF, 631 KB
english, 2017