Post-Silicon Validation in the SoC Era: A Tutorial Introduction
Mishra, Prabhat, Morad, Ronny, Ziv, Avi, Ray, SandipVolume:
34
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/MDAT.2017.2691348
Date:
June, 2017
File:
PDF, 1.40 MB
english, 2017