SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Interferometry XVIII - Two-step phase shifting interferometry technique for evaluation of fatigue process zone parameters in notched specimens
Creath, Katherine, Burke, Jan, Albertazzi Gonçalves, Armando, Muravsky, Leonid I., Picart, Pascal, Kmet', Arkady B., Voronyak, Taras I., Ostash, Orest P., Stasyshyn, Ihor V.Volume:
9960
Year:
2016
Language:
english
DOI:
10.1117/12.2236456
File:
PDF, 1.11 MB
english, 2016