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FIB Based Fabrication of an Operative Pt/HfO 2 /TiN Device for Resistive Switching inside a Transmission Electron Microscope
Zintler, A., Kunz, U., Pivak, Y., Sharath, S.U., Vogel, S., Kleebe, H.-J., Alff, L., Molina-Luna, L.Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.04.008
Date:
April, 2017
File:
PDF, 1.11 MB
english, 2017