[IEEE 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2016.10.3-2016.10.6)] 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Increased accuracy of microwave transistor S-parameters measurements
Ryasnyi, Yu. V., Chashkov, M. S.Year:
2016
Language:
english
DOI:
10.1109/APEIE.2016.7802248
File:
PDF, 480 KB
english, 2016