Impact Ionization in SOI MESFETs at the 32-nm Node

IEEE Transactions on Electron Devices 2016 / 10 Vol. 63; Iss. 10

Impact Ionization in SOI MESFETs at the 32-nm Node

Thornton, Trevor J., Lepkowski, William, Wilk, Seth J.
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Volume:
63
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2601241
Date:
October, 2016
File:
PDF, 764 KB
english, 2016
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