Influence of substrate temperature on the structural, morphological, optical and electrical properties of copper telluride thin films prepared by electron beam evaporation method
Bhuvaneswari, P.V., Ramamurthi, K., Ramesh Babu, R.Volume:
632
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2017.04.035
Date:
June, 2017
File:
PDF, 791 KB
english, 2017