Reliability evaluation of high-performance, low-power FinFET standard cells based on mixed RBB/FBB technique
Wang, Tian, Cui, Xiaoxin, Ni, Yewen, Liao, Kai, Liao, Nan, Yu, Dunshan, Cui, XiaoleVolume:
38
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/38/4/044005
Date:
April, 2017
File:
PDF, 4.09 MB
english, 2017