[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) - Bogota, Colombia (2017.3.13-2017.3.15)] 2017 18th IEEE Latin American Test Symposium (LATS) - Protecting analog circuits with parameter biasing obfuscation
Rao, Vaibhav Venugopal, Savidis, IoannisYear:
2017
Language:
english
DOI:
10.1109/LATW.2017.7906739
File:
PDF, 537 KB
english, 2017