[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) -...

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[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) - Bogota, Colombia (2017.3.13-2017.3.15)] 2017 18th IEEE Latin American Test Symposium (LATS) - Low cost automatic test vector generation for structural analog testing

Chinazzo, Andre L., de Aguirre, Paulo C. Comassetto, Balen, Tiago R.
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Year:
2017
Language:
english
DOI:
10.1109/LATW.2017.7906740
File:
PDF, 702 KB
english, 2017
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