[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) - Bogota, Colombia (2017.3.13-2017.3.15)] 2017 18th IEEE Latin American Test Symposium (LATS) - Fault injection methodology for single event effects on clock-gated ASICs
Benites, Luis Alberto Contreras, Kastensmidt, Fernanda LimaYear:
2017
Language:
english
DOI:
10.1109/LATW.2017.7906742
File:
PDF, 371 KB
english, 2017