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[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) - Bogota, Colombia (2017.3.13-2017.3.15)] 2017 18th IEEE Latin American Test Symposium (LATS) - Exploring BDDs to reduce test pattern set
Porto, Gabriel S., Butzen, Paulo F., Franco, Denis T.Year:
2017
Language:
english
DOI:
10.1109/LATW.2017.7906743
File:
PDF, 326 KB
english, 2017