[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) - Bogota, Colombia (2017.3.13-2017.3.15)] 2017 18th IEEE Latin American Test Symposium (LATS) - Ionizing radiation effects on a COTS low-cost RISC microcontroller
Leite, Felipe G. H., Santos, Roberto B. B., Medina, Nilberto H., Aguiar, Vitor. A. P., Giacomini, Renato C., Added, Nemitala, Aguirre, Fernando, Macchione, Eduardo L.A., Vargas, Fabian, da Silveira, MYear:
2017
Language:
english
DOI:
10.1109/LATW.2017.7906762
File:
PDF, 455 KB
english, 2017