[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) - Bogota, Colombia (2017.3.13-2017.3.15)] 2017 18th IEEE Latin American Test Symposium (LATS) - A DMA and CACHE-based stress schema for burn-in of automotive microcontroller
Bernardi, P., Cantoro, R., Gianotto, L., Restifo, M., Sanchez, E., Venini, F., Appello, D.Year:
2017
Language:
english
DOI:
10.1109/LATW.2017.7906767
File:
PDF, 923 KB
english, 2017