[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) - Bogota, Colombia (2017.3.13-2017.3.15)] 2017 18th IEEE Latin American Test Symposium (LATS) - Contrast of a HDL model and COTS version of a microprocessor for soft-error testing
Isaza-Gonzalez, Jose, Serrano-Cases, Alejandro, Martinez-Alvarez, Antonio, Cuenca-Asensi, Sergio, Guzman-Miranda, H., Aguirre, Miguel A.Year:
2017
Language:
english
DOI:
10.1109/LATW.2017.7906771
File:
PDF, 988 KB
english, 2017