New Technology and Approaches for the Acceleration and Enhancement of Microstructural Characterization using Electron Backscatter Diffraction
Nowell, Matthew M., Wright, Stuart I., Rampton, Travis, Stromberg, Ryan J., Bhowmich, Sanjit, Shibata, Masateru, Erdman, NatashaVolume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615006650
Date:
August, 2015
File:
PDF, 92 KB
english, 2015