Key Issues and Solutions for Characterizing Hot Carrier...

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IEEE Transactions on Electron Devices 2017

Key Issues and Solutions for Characterizing Hot Carrier Aging of Nanometer Scale nMOSFETs

Duan, Meng, Zhang, Jian Fu, Ji, Zhigang, Zhang, Wei Dong, Kaczer, Ben, Asenov, Asen
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2691008
File:
PDF, 2.25 MB
english, 2017
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