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SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 28 January 2017)] Design and Quality for Biomedical Technologies X - Depth-of-focus extended chromatic dual-foci OCT (Conference Presentation)
Raghavachari, Ramesh, Liang, Rongguang, Pfefer, T. Joshua, Li, JinhanVolume:
10056
Year:
2017
Language:
english
DOI:
10.1117/12.2249970
File:
PDF, 108 KB
english, 2017