Electron probeX-ray microanalysis for the assessment of...

Electron probeX-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level

Stefaan Hoornaert, Boris Treiger, Vlado Valkovic, René Van Grieken
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Volume:
128
Year:
1998
Language:
english
Pages:
7
DOI:
10.1007/bf01243051
File:
PDF, 762 KB
english, 1998
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