Electron probeX-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level
Stefaan Hoornaert, Boris Treiger, Vlado Valkovic, René Van GriekenVolume:
128
Year:
1998
Language:
english
Pages:
7
DOI:
10.1007/bf01243051
File:
PDF, 762 KB
english, 1998