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[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - Transparent Offloading of Computational Hotspots from Binary Code to Xeon Phi
Damschen, Marvin, Riebler, Heinrich, Vaz, Gavin, Plessl, ChristianYear:
2015
Language:
english
DOI:
10.7873/date.2015.1124
File:
PDF, 261 KB
english, 2015