Organic surface analysis with time-of-flight SIMS

Organic surface analysis with time-of-flight SIMS

Hans van der Wel, Johan Lub, Peter N. T. van Velzen, Alfred Benninghoven
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Volume:
101
Year:
1990
Language:
english
Pages:
16
DOI:
10.1007/bf01244153
File:
PDF, 953 KB
english, 1990
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