Application of total-reflection X-ray fluorescence...

Application of total-reflection X-ray fluorescence spectrometry in material analysis

Peter Hoffmann, Martin Kein, Volker Scheuer, Karl Heinrich Lieser
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Volume:
101
Year:
1990
Language:
english
Pages:
9
DOI:
10.1007/bf01244183
File:
PDF, 385 KB
english, 1990
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