![](/img/cover-not-exists.png)
[IEEE 1979 IEEE International Symposium on Electromagnetic Compatibility - San Diego, CA (1979.10.9-1979.10.11)] 1979 IEEE International Symposium on Electromagnetic Compatibility - Using NCAP to Predict RFI Effects in Operational Amplifiers
Fang, Ta Fang, Whalen, James J., Chen, Gordon K. C.Year:
1979
Language:
english
DOI:
10.1109/isemc.1979.7568796
File:
PDF, 633 KB
english, 1979